Abstract: In software development, test redundancy increases resource consumption and execution time. To address this problem, Test Redundancy Reduction (TRR) has emerged as a critical optimization ...
Abstract: The double pulse test (DPT) configuration plays a critical role in the dynamic characterization of SiC MOSFETs due to their high dv/dt and di/dt rates. This paper investigates the impact of ...
Providing utility professionals with critical information related to the planning, design, construction, operations, maintenance and safety of transmission and distribution facilities, including ...
ABSTRACT: Software testability took a lot of interests of software community. Indeed, this concept has been interpreted in a variety of ways. One interpretation is concerned with the extent of the ...
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