Researchers developed a color-changing material that alters both surface texture and appearance in seconds, inspired by ...

Researchers developed a method to enhance 3D imaging of lithium-ion battery electrodes, improving visualization of internal ...

Researchers found silica can outperform high-index materials for optical metasurfaces. Its chip-making compatibility enables ...

Efficiently identify and map tire fillers with streamlined material analysis—explore the details in this application note.

It’s been a couple of weeks since Trustmarque and Ultima came together, but already the business has sealed its first cross-selling deal and its boss has outlined ambitions to keep the momentum going ...

(a) A scanning electron microscope (SEM) image of the nanoneedle probe used for the measurements. (b) Elasticity map of a 1 µm × 1 µm area on the nuclear surface, showing the change in elasticity ...

STARKVILLE, Miss.—Mississippi State’s Institute for Imaging and Analytical Technologies soon will be home to a scanning electron microscope so advanced that it will be the first of its kind in the ...

Abstract: Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus. Signal-to-noise ratio (SNR) ...

Advanced light microscopy techniques are giving scientists a new understanding of human biology and what goes wrong in diseases Katarina Zimmer, Knowable Magazine Innovative techniques are helping ...

Mohamed Khalil Elhachimi does not work for, consult, own shares in or receive funding from any company or organization that would benefit from this article, and has disclosed no relevant affiliations ...

1 Institute of Molecular Anthropology, Paris, France. 2 Laboratory of Physico-Chemical Analysis, UST de Compiègne, Compiègne, France. 3 Institute of Physics of the Globe, Paris, France. We have ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...