A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
SAN MATEO, Calif. — Design-for-test tool vendor SynTest Technologies Inc. is putting the finishing touches on a test-data volume compaction technology for scan-based design. VirtualScan will help ...
The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...
As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
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