Abstract: In this manuscript, parametric independent control of DC-DC boost converter using two degree of freedom internal model control scheme has been proposed. The control scheme can handle the set ...
Abstract: The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, ...
At the moment, when running a PARAMETRIC test locally, my console log output becomes completely filled with noise (which seems to include a lot of things, for example, the std. output of the weblog, ...
ABSTRACT: Healthcare decisions are based on scientific evidence obtained from medical studies by gathering data and analyzing it to obtain the best results. When analyzing data, biostatistics is a ...
1 Department of Business Administration, Graduate Education Institute, Karabük University, Karabük, Türkiye. 2 Department of International Relations, Faculty of Business and Management Sciences, ...
The semiconductor devices that bring artificial intelligence (AI) and machine learning (ML) to the cloud as well as to the edge present significant test challenges. The semiconductor test industry is ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
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