Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
Abstract: Test cost has become a critical issue for large industrial integrated circuits. Various test compression techniques have been adopted in the industry to reduce test cost. However, ...
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