A new valve for quantum matter: Steering chiral fermions by geometry alone

A collaboration between Stuart Parkin's group at the Max Planck Institute of Microstructure Physics in Halle (Saale) and ...
IEEE

Heavy Ion-Induced Single-Event Leakage Current and Burnout in Homojunction GaN p-i-n Diodes

Abstract: The impact of edge termination design on heavy-ion induced single-event leakage current (SELC) and single-event burnout (SEB) is investigated in homojunction gallium nitride (GaN) vertical p ...
IEEE

Analysis of Single-Event Leakage Current Degradation Induced by Heavy-Ion Irradiation in SiC MOSFETs

Abstract: The application of silicon carbide MOSFETs (SiC MOSFETs) in space is severely restricted by single-event burnout (SEB) and single-event leakage current (SELC) induced by heavy ions, yet the ...