Provide practical KPIs to monitor, including FA hit rate (percent of FAs that find root cause) and time to address yield ...
Test Development team is seeking a Silicon Design Engineer to have an exciting career on Scan, MBIST, iJTAG test development ...
Abstract: Scan-Based Design-For-Testability (DFT) measures are prevalent in modern digital integrated circuits to achieve high test quality at low hardware cost. With the advent of 3D heterogeneous ...
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