NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida ...
Abstract: To meet the growing demands for automation and intelligence in the quality inspection of computer motherboard assembly, this study proposes an improved defect detection method based on ...
Abstract: The combination of Visual Guidance and Extended Reality (XR) technology holds the potential to greatly improve the performance of human workforces in numerous areas, particularly industrial ...