Abstract: This paper proposes BER evaluation system that evaluates BER of TLC and QLC NAND flash memories with reliability information such as write and erase (W/E) cycle and data-retention time by ...
Abstract: NAND flash memory – ubiquitous in today’s world of smart phones, SSDs (solid state drives), and cloud storage – has a number of well-known reliability ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback