Semiconductor Engineering

Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...
Semiconductor Engineering

Airbus A320 Recall: Rethinking Fault Testing In Aerospace

Safety mechanisms designed to handle rare events can become unreliable under sustained or intense fault conditions.
POWER Magazine

Generator Bearing Failures: Root Cause Analysis and the Role of Integrated Data

Learn how root cause analysis and integrated data prevent hydropower bearing failures, reduce costly downtime, and improve ...
IEEE

An EPS-kNN Fault Propagation Analysis Method for Industrial Processes Based on the Fusion of Knowledge and Data

Abstract: To reduce the false connections resulting from numerous redundant paths in the fault propagation analysis for industrial processes, an equal probability symbolized k-nearest neighbors ...
IEEE

Enhanced Bearing Fault Detection in Induction Motors Using Projection-Based SVM

Abstract: Fine-tuning the hyperparameters of the Support Vector Machine (SVM) is crucial to making it an accurate classifier in fault detection. The convergence rate of the optimiser and its ...
PBS

U.S. government admits negligence in DC midair collision that killed 67 people

WASHINGTON (AP) — The U.S. government admitted Wednesday that the Federal Aviation Administration and the Army played a role in causing the collision last January between an airliner and a Black Hawk ...