Semiconductor Engineering

Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...
Semiconductor Engineering

Airbus A320 Recall: Rethinking Fault Testing In Aerospace

Safety mechanisms designed to handle rare events can become unreliable under sustained or intense fault conditions.
IEEE

A Noncontact Open-Circuit Fault Detection Method for VSI Systems Using High-Frequency Common-Mode Switching Oscillations

Abstract: Fault diagnosis is essential for enhancing the reliability of voltage source inverter (VSI) systems. This article proposes a rapid, noncontact method for detecting open-circuit faults (OCFs) ...
POWER Magazine

Generator Bearing Failures: Root Cause Analysis and the Role of Integrated Data

Learn how root cause analysis and integrated data prevent hydropower bearing failures, reduce costly downtime, and improve ...

Japanese nuclear plant operator fabricated seismic risk data

On Wednesday, Japan’s Nuclear Regulation Authority announced that it is halting the relicensing process for two reactors at ...
IEEE

Fault Propagation Analysis and Optimum Placement of Sensors for Fault Diagnosis Based on Combined Weighting-TOPSIS Method

Abstract: Mechanical transmission systems are widely used in the aerospace field, but its incipient fault characteristic periodic signals are in low frequency band and often buried in the noise, so ...