Electronics Weekly

Lee Harrison explains the technology behind, full In-System ATPG testing for advanced semiconductors

We had a fantastic time at the Bankside Hilton for the 2025 Elektra Awards, which were hosted by the excellent comedian Lucy Porter. Take a look at some of the highlights from the event that took ...
IEEE

Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration

Abstract: This article focuses on recalibration of neural networks implemented in neuromorphic in-memory computing with memristors. The primary goal of the article is to reduce the amount of data ...
IEEE

RDT: An Optimized Automatic Test Pattern Generation Method Based on Robust Decision Tree

Abstract: Automatic Test Pattern Generation (ATPG) is a crucial technology in digital circuit testing. However, as circuit complexity increases, traditional methods face significant challenges, ...
GitHub

ESP Exception Decoder helps you understand crash stack traces and backtraces from ESP8266 and ESP32 boards.

Arduino IDE 2.2.x support is deprecated. Starting with version 2.x, ESP Exception Decoder targets Visual Studio Code and requires BoardLab. Arduino IDE 2.2.x users ...