Abstract: A structural test technique known as "built-in self-test," or BIST, involves adding logic to an IC so that it can periodically test its own functionality. Memory BIST and logic BIST are the ...
Engaging System 2 requires significant metabolic energy. Your brain consumes a lot of your body’s energy as it is; intense ...
Abstract: Test data compression implies that a compressed test set is stored on a tester, and an on-chip decompression logic produces tests that can be applied to the circuit from compressed tests.
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