Electronic Design

ATE – Design for Test – Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
EDN

Design for test boot camp, part 1: Scan test

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...
EDN

Design for test boot camp, part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
Semiconductor Engineering

Test Data Streaming For The Next Generation Of Designs

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...
Electronic Design

The Importance of Test Points in Circuit Design

Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...